An Improved Residual Chi-Square Test Fault Isolation...

IEEE Access 2019 Vol. 7

An Improved Residual Chi-Square Test Fault Isolation Approach in Four-Gyro SINS

Cheng, Jianhua, Sun, Xiangyu, Liu, Ping, Mou, Hongjie
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Volume:
7
Year:
2019
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2019.2957103
File:
PDF, 1.06 MB
2019
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