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A perspective on multiparameter quantum metrology: From theoretical tools to applications in quantum imaging
Albarelli, F., Barbieri, M., Genoni, M.G., Gianani, I.Language:
english
Journal:
Physics Letters A
DOI:
10.1016/j.physleta.2020.126311
Date:
February, 2020
File:
PDF, 905 KB
english, 2020