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Adjacency criticality: a simple yet effective metric for statistical timing yield optimisation of digital integrated circuits
Ebrahimipour, Seyed Milad, Ghavami, Behnam, Raji, MohsenVolume:
13
Journal:
IET Circuits, Devices & Systems
DOI:
10.1049/iet-cds.2018.5616
Date:
October, 2019
File:
PDF, 1.92 MB
2019