Adjacency criticality: a simple yet effective metric for...

Adjacency criticality: a simple yet effective metric for statistical timing yield optimisation of digital integrated circuits

Ebrahimipour, Seyed Milad, Ghavami, Behnam, Raji, Mohsen
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Volume:
13
Journal:
IET Circuits, Devices & Systems
DOI:
10.1049/iet-cds.2018.5616
Date:
October, 2019
File:
PDF, 1.92 MB
2019
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