Voids and vacancy-type defects in SiO 2...

Journal of Applied Physics 2020 / 02 Vol. 127; Iss. 5

Voids and vacancy-type defects in SiO 2 /GaN structures probed by monoenergetic positron beams

Uedono, Akira, Ueno, Wataru, Yamada, Takahiro, Hosoi, Takuji, Egger, Werner, Koschine, Tönjes, Hugenschmidt, Christoph, Dickmann, Marcel, Watanabe, Heiji
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Volume:
127
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5134513
Date:
February, 2020
File:
PDF, 2.00 MB
2020
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