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The influence of ZnO layer thickness on the performance and electrical bias stress instability in ZnO thin film transistors
Ngwashi, Divine Khan, Mih, Thomas Attia, Cross, Richard B MJournal:
Materials Research Express
DOI:
10.1088/2053-1591/ab6eee
Date:
January, 2020
File:
PDF, 1.19 MB
2020