Hot-Carrier-Induced Degradation and Optimization for 700-V High-Voltage Lateral DMOS by the AC Stress
Liu, Siyang, He, Boyong, Su, Wei, Lu, Li, Ye, Ran, Wu, Haibo, Chen, Hongting, Wu, Wangran, Sun, Weifeng, Ma, Shulang, Liu, YuweiYear:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2967349
File:
PDF, 2.28 MB
2020