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[IEEE 2019 IEEE International Ultrasonics Symposium (IUS) - Glasgow, United Kingdom (2019.10.6-2019.10.9)] 2019 IEEE International Ultrasonics Symposium (IUS) - Multi-Class Classification of Defect Types in Ultrasonic NDT Signals with Convolutional Neural Networks
Virupakshappa, Kushal, Oruklu, ErdalYear:
2019
DOI:
10.1109/ULTSYM.2019.8926027
File:
PDF, 870 KB
2019