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[IEEE 2019 International Conference on Electrical, Electronics and Computer Engineering (UPCON) - ALIGARH, India (2019.11.8-2019.11.10)] 2019 International Conference on Electrical, Electronics and Computer Engineering (UPCON) - Comparison of Linearity and Intermodulation Distortion Metrics for T - and Pi - Gate HEMT
Sehra, Khushwant, Kumari, Vandana, Nath, Vandana, Gupta, Mridula, Rawal, D. S., Saxena, ManojYear:
2019
DOI:
10.1109/UPCON47278.2019.8980221
File:
PDF, 5.72 MB
2019