[IEEE 33rd IEEE International Reliability Physics Symposium - Las Vegas, NV, USA (1995.04.17-1995.04.21)] 33rd IEEE International Reliability Physics Symposium - Degradation of Blue AlGaN/InGaN/GaN LEDs Subjected to High Current Pulses
Barton, Daniel L., Zeller, Joachim, Phillips, B. Scott, Chiu, Pei-Chih, Askar, Sabrina, Lee, Dong-Seung, Osiniski, Marek, Malloy, Kevin J.Year:
1995
DOI:
10.1109/irps.1995.363695
File:
PDF, 1.29 MB
1995