[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - In-depth Analysis of 10 nm Exynos Processor using Micro CT and FIB-SEM System
Sharang, S, Dluhos, Jiri, Kalasova, Dominika, Denisyuk, Andrey, Vana, Rostislav, Zikmund, Tomas, Kaiser, Jozef, Obona, Jozef VincencYear:
2019
DOI:
10.1109/IPFA47161.2019.8984907
File:
PDF, 5.22 MB
2019