The Impact of Hot Electrons and Self-Heating During...

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IEEE Transactions on Electron Devices 2020

The Impact of Hot Electrons and Self-Heating During Hard-Switching in AlGaN/GaN HEMTs

Yang, Feiyuan, Dalcanale, Stefano, Gajda, Mark, Karboyan, Serge, Uren, Michael J., Kuball, Martin
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Year:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2968212
File:
PDF, 1.99 MB
2020
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