Electrical characterization of RuO x...

AIP Advances 2020 / 01 Vol. 10; Iss. 1

Electrical characterization of RuO x / n -GaN Schottky diodes formed by oxidizing ruthenium thin-films in normal laboratory air

Allen, Noah, Ciarkowski, Timothy, Carlson, Eric, Chakraborty, Amrita, Guido, Louis
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Volume:
10
Journal:
AIP Advances
DOI:
10.1063/1.5125784
Date:
January, 2020
File:
PDF, 1.46 MB
2020
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