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[IEEE 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Auckland, New Zealand (2019.5.20-2019.5.23)] 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Defect Feature Extraction in Eddy Current Testing Based on Convolutional Sparse Coding
Tao, Yang, Xu, Hanyang, Avila, Jorge R. Salas, Ktistis, Christos, Yin, Wuliang, Peyton, Anthony J.Year:
2019
DOI:
10.1109/I2MTC.2019.8826935
File:
PDF, 1.52 MB
2019