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TID effects on IâV characteristics of bulk CMOS STD and ELT-based devices in 600â¯nm
Vaz, Pablo I., Wirth, Gilson I., Vidor, Fábio F., Both, Thiago H.Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2020.104722
Date:
February, 2020
File:
PDF, 8.78 MB
2020