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[IEEE 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Hangzhou, China (2019.10.21-2019.10.23)] 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Susceptibility Testing of RF Front End Using Differential-Mode Injection Method
Lu, Xinfu, Wei, Guanghui, Pan, Xiaodong, Wan, HaojiangYear:
2019
DOI:
10.1109/EMCCompo.2019.8919732
File:
PDF, 5.76 MB
2019