Interfacial Charge Dynamics in Metal-Oxide–Semiconductor...

Physical Review Applied 2020 / 1 Vol. 13; Iss. 1

Interfacial Charge Dynamics in Metal-Oxide–Semiconductor Structures: The Effect of Deep Traps and Acceptor Levels in

Sharabani, Y., Palmieri, Andrea, Kyrtsos, Alexandros, Matsubara, Masahiko, Bellotti, Enrico
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Volume:
13
Journal:
Physical Review Applied
DOI:
10.1103/PhysRevApplied.13.014007
Date:
January, 2020
File:
PDF, 1.66 MB
2020
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