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[IEEE 2019 International Conference on Cutting-edge Technologies in Engineering (ICon-CuTE) - Uttar Pradesh, India (2019.11.14-2019.11.16)] 2019 International Conference on Cutting-edge Technologies in Engineering (ICon-CuTE) - Performance Analysis of Double Gate Heterojunction Tunnel Field Effect Transistor
Pindoo, Irfan Ahmad, Sinha, Sanjeet K., Tripathi, Suman LataYear:
2019
DOI:
10.1109/ICon-CuTE47290.2019.8991467
File:
PDF, 640 KB
2019