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[IEEE 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) - Long Beach, CA, USA (2019.6.15-2019.6.20)] 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) - Spot and Learn: A Maximum-Entropy Patch Sampler for Few-Shot Image Classification
Chu, Wen-Hsuan, Li, Yu-Jhe, Chang, Jing-Cheng, Wang, Yu-Chiang FrankYear:
2019
DOI:
10.1109/CVPR.2019.00641
File:
PDF, 292 KB
2019