[IEEE 2019 International Conference on Information and Communication Technology Convergence (ICTC) - Jeju Island, Korea (South) (2019.10.16-2019.10.18)] 2019 International Conference on Information and Communication Technology Convergence (ICTC) - Development of Edge-based Deep Learning Prediction Model for Defect Prediction in Manufacturing Process
Lee, Kyung-Taek, Lee, Youn-Sung, Yoon, HyoseokYear:
2019
DOI:
10.1109/ICTC46691.2019.8939905
File:
PDF, 1.76 MB
2019