Deep Learning Approach for Apple Edge Detection to Remotely...

IEEE Access 2020 Vol. 8

Deep Learning Approach for Apple Edge Detection to Remotely Monitor Apple Growth in Orchards

Wang, Dandan, Li, Changying, Song, Huaibo, Xiong, Hongting, Liu, Chang, He, Dongjian
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Volume:
8
Year:
2020
Language:
english
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2020.2971524
File:
PDF, 5.73 MB
english, 2020
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