[IEEE 2019 IEEE International Electron Devices Meeting...

  • Main
  • [IEEE 2019 IEEE International Electron...

[IEEE 2019 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2019.12.7-2019.12.11)] 2019 IEEE International Electron Devices Meeting (IEDM) - High Volume Electrical Characterization of Semiconductor Qubits

Pillarisetty, R., Kashani, N., Keys, P., Kotlyar, R., Luthi, F., Michalak, D., Millard, K., Roberts, J., Torres, J., Zietz, O., Krahenmann, T., George, H. C., Zwerver, A. - M., Veldhorst, M., Scappucc
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2019
Language:
english
DOI:
10.1109/IEDM19573.2019.8993587
File:
PDF, 4.91 MB
english, 2019
Conversion to is in progress
Conversion to is failed