[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Stamenkovic, Zoran, Bosio, Alberto, Cserey, Gyorgy, Novak, Ondrej, Pleskacz, Witold, Sekanina, Lukas, Steininger, Andreas, Stojanovic, Goran, Stopjakova, VieraYear:
2019
Language:
english
DOI:
10.1109/ITC44170.2019.9000137
File:
PDF, 11.91 MB
english, 2019