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[IEEE 2019 IEEE Symposium Series on Computational Intelligence (SSCI) - Xiamen, China (2019.12.6-2019.12.9)] 2019 IEEE Symposium Series on Computational Intelligence (SSCI) - Design of IGBT Parameter Automatic Test System Based on LabVIEW
Cai, Xiumei, Bian, Jingwei, Wang, Yan, Ning, YingyueYear:
2019
Language:
english
DOI:
10.1109/SSCI44817.2019.9003135
File:
PDF, 4.32 MB
english, 2019