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Investigations on Averaging Mechanisms of Virtual Junction Temperature Determined by VCE(T) Method for IGBTs
Chen, Jie, Deng, Erping, Xie, Luhong, Ying, Xiaoliang, Huang, YongzhangYear:
2020
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2969727
File:
PDF, 1019 KB
english, 2020