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[IEEE 2019 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2019.12.7-2019.12.11)] 2019 IEEE International Electron Devices Meeting (IEDM) - A physics-aware compact modeling framework for transistor aging in the entire bias space
Wu, Zhicheng, Linten, Dimitri, Kaczer, Ben, Franco, Jacopo, Roussel, Philippe J., Tyaginov, Stanislav, Trujen, Brecht, Vandemale, Michiel, Hellings, Geert, Collaert, Nadine, Groeseneken, GuidoYear:
2019
Language:
english
DOI:
10.1109/iedm19573.2019.8993603
File:
PDF, 2.67 MB
english, 2019