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Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy
Powell, Cedric J.Volume:
38
Language:
english
Journal:
Journal of Vacuum Science & Technology A
DOI:
10.1116/1.5141079
Date:
March, 2020
File:
PDF, 2.67 MB
english, 2020