Threshold Voltage Degradation for n-Channel 4H-SiC Power...

Journal of Low Power Electronics and Applications 2020 / 01 Vol. 10; Iss. 1

Threshold Voltage Degradation for n-Channel 4H-SiC Power MOSFETs

Guevara, Esteban, Herrera-Pérez, Victor, Rocha, Cristian, Guerrero, Katherine
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Volume:
10
Language:
english
Journal:
Journal of Low Power Electronics and Applications
DOI:
10.3390/jlpea10010003
Date:
January, 2020
File:
PDF, 3.26 MB
english, 2020
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