Cross-shaped markers for the preparation of site-specific transmission electron microscopy lamellae using focused ion beam techniques
O'Hanlon, T.J., Bao, A., Massabuau, F.C.-P., Kappers, M.J., Oliver, R.A.Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2020.112970
Date:
February, 2020
File:
PDF, 1.39 MB
english, 2020