[IEEE 2019 18th IEEE International Conference On Machine Learning And Applications (ICMLA) - Boca Raton, FL, USA (2019.12.16-2019.12.19)] 2019 18th IEEE International Conference On Machine Learning And Applications (ICMLA) - Scalable Deep Learning for Stress and Affect Detection on Resource-Constrained Devices
Ragav, Abhijith, Krishna, Nanda Harishankar, Narayanan, Naveen, Thelly, Kevin, Vijayaraghavan, VineethYear:
2019
Language:
english
DOI:
10.1109/ICMLA.2019.00261
File:
PDF, 997 KB
english, 2019