[IEEE 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) - Chongqing, China (2019.10.11-2019.10.13)] 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) - Deep Learning: Excellent Method at Surface Defect Detection of Industrial Products
Li, Bijiang, Zhang, Xuejun, Liang, Chan, Wei, TaoYear:
2019
Language:
english
DOI:
10.1109/IMCEC46724.2019.8984019
File:
PDF, 1.71 MB
english, 2019