[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - A single-event irradiation failure analysis test system for high speed digital-to-analog converter
Wei, Yafeng, Li, Jing, Yu, Zhou, Chen, Chao, Liu, Jun, Wen, Xianchao, Wang, Jian'anYear:
2019
Language:
english
DOI:
10.1109/IPFA47161.2019.8984795
File:
PDF, 4.70 MB
english, 2019