[IEEE 2019 IEEE International Test Conference (ITC) -...

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[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - Resiliency of automotive object detection networks on GPU architectures

Lotfi, Atieh, Hukerikar, Saurabh, Balasubramanian, Keshav, Racunas, Paul, Saxena, Nirmal, Bramley, Richard, Huang, Yanxiang
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Year:
2019
Language:
english
DOI:
10.1109/ITC44170.2019.9000150
File:
PDF, 3.87 MB
english, 2019
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