Robust Linear Trend Test for Low-Coverage Next-Generation Sequence Data Controlling for Covariates
Lee, Jung, Kim, Myeong-Kyu, Kim, WonkukVolume:
8
Language:
english
Journal:
Mathematics
DOI:
10.3390/math8020217
Date:
February, 2020
File:
PDF, 526 KB
english, 2020