Robust Linear Trend Test for Low-Coverage Next-Generation...

Robust Linear Trend Test for Low-Coverage Next-Generation Sequence Data Controlling for Covariates

Lee, Jung, Kim, Myeong-Kyu, Kim, Wonkuk
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Volume:
8
Language:
english
Journal:
Mathematics
DOI:
10.3390/math8020217
Date:
February, 2020
File:
PDF, 526 KB
english, 2020
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