Electronic transport and noise characterization in MoS2
Pascual Corral, Elena, Iglesias, José M., Martin, Maria J, Rengel, RaulLanguage:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab7777
Date:
February, 2020
File:
PDF, 4.02 MB
english, 2020