Electronic transport and noise characterization in MoS2

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  • Electronic transport and noise characterization in MoS2

Electronic transport and noise characterization in MoS2

Pascual Corral, Elena, Iglesias, José M., Martin, Maria J, Rengel, Raul
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Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab7777
Date:
February, 2020
File:
PDF, 4.02 MB
english, 2020
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