[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - Structural Test and Functional Test for Digital Acoustofluidic Biochips
Zhong, Zhanwei, Zhu, Haodong, Zhang, Peiran, Huang, Tony Jun, Chakrabarty, KrishnenduYear:
2019
Language:
english
DOI:
10.1109/ITC44170.2019.9000140
File:
PDF, 8.37 MB
english, 2019