Amplitude Difference Changes-Based Metrological Scheme for...

IEEE Sensors Journal 2020 / 3 Vol. 20; Iss. 6

Amplitude Difference Changes-Based Metrological Scheme for Force Detection in a Mode-Localized 5-Beam Array

Liu, Shuyi, Wang, Dong F., Zhou, Di, Hong, Jing, Maeda, Ryutaro
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Volume:
20
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2019.2955151
Date:
March, 2020
File:
PDF, 3.12 MB
english, 2020
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