Ion-Beam and X-Ray Methods of Elemental Diagnostics of Thin...

Ion-Beam and X-Ray Methods of Elemental Diagnostics of Thin Film Coatings

Egorov, V. K., Egorov, E. V., Afanas’ev, M. S.
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Volume:
61
Language:
english
Journal:
Physics of the Solid State
DOI:
10.1134/S1063783419120114
Date:
December, 2019
File:
PDF, 665 KB
english, 2019
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