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Preliminary study on using near-infrared spectroscopy at 1.6â2.4 µm for document examination
Sugawara, Shigeru, Huck, Christian W.Volume:
105
Journal:
Infrared Physics & Technology
DOI:
10.1016/j.infrared.2020.103212
Date:
March, 2020
File:
PDF, 2.01 MB
2020