[IEEE 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) - Chongqing, China (2019.10.11-2019.10.13)] 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) - Connecting rod surface defect detection system based on HALCON
Zheng, Bin, Guo, MianJin, Jingdong, Zhang, Zhi, ChuanYin, Du, JunJieYear:
2019
DOI:
10.1109/IMCEC46724.2019.8983964
File:
PDF, 476 KB
2019