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High-Voltage and High-Current IdâVds Measurement Method for Power Transistors Improved by Reducing Self-Heating
Nakamura, Yohei, Kuroda, Naotaka, Yanagi, Tatsuya, Sakairi, Hiroyuki, Nakahara, KenYear:
2020
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.2974492
File:
PDF, 909 KB
2020