[IEEE 2018 IEEE Conference on Visual Analytics Science and Technology (VAST) - Berlin, Germany (2018.10.21-2018.10.26)] 2018 IEEE Conference on Visual Analytics Science and Technology (VAST) - VAST Challenge 2018: Mini-Challenge 1 Award: Applied Visual Data Science
Rukavina, Andrei, Banchero, SergioYear:
2018
DOI:
10.1109/VAST.2018.8802505
File:
PDF, 8.90 MB
2018