Source Consistency Electrical Impedance Tomography

SIAM Journal on Applied Mathematics 2020 / 01 Vol. 80; Iss. 1

Source Consistency Electrical Impedance Tomography

Zhang, Tingting, Jang, Geuk Young, Oh, Tong In, Jeung, Kyung Woon, Wi, Hun, Woo, Eung Je
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Volume:
80
Journal:
SIAM Journal on Applied Mathematics
DOI:
10.1137/18M1225264
Date:
January, 2020
File:
PDF, 10.86 MB
2020
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