![](/img/cover-not-exists.png)
[IEEE 2019 IEEE International Conference on Big Data (Big Data) - Los Angeles, CA, USA (2019.12.9-2019.12.12)] 2019 IEEE International Conference on Big Data (Big Data) - Mining High-Utility Sequential Patterns from Big Datasets
Lin, Jerry Chun-Wei, Li, Yuanfa, Fournier-Viger, Philippe, Djenouri, Youcef, Wang, Leon Shyue-LiangYear:
2019
Language:
english
DOI:
10.1109/BigData47090.2019.9005996
File:
PDF, 1.60 MB
english, 2019