[IEEE 2019 IEEE International Conference on Big Data (Big...

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[IEEE 2019 IEEE International Conference on Big Data (Big Data) - Los Angeles, CA, USA (2019.12.9-2019.12.12)] 2019 IEEE International Conference on Big Data (Big Data) - Mining High-Utility Sequential Patterns from Big Datasets

Lin, Jerry Chun-Wei, Li, Yuanfa, Fournier-Viger, Philippe, Djenouri, Youcef, Wang, Leon Shyue-Liang
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Year:
2019
Language:
english
DOI:
10.1109/BigData47090.2019.9005996
File:
PDF, 1.60 MB
english, 2019
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