HEAP: A Holistic Error Assessment Framework for Multiple...

Electronics 2020 / 02 Vol. 9; Iss. 2

HEAP: A Holistic Error Assessment Framework for Multiple Approximations Using Probabilistic Graphical Models

Jiao, Jiajia
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9
Language:
english
Journal:
Electronics
DOI:
10.3390/electronics9020373
Date:
February, 2020
File:
PDF, 550 KB
english, 2020
Conversion to is in progress
Conversion to is failed