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GaP/Si(001) interface study by XPS in combination with Ar gas cluster ion beam sputtering
Romanyuk, O., Gordeev, I., Paszuk, A., Supplie, O., Stoeckmann, J.P., Houdkova, J., Ukraintsev, E., BartoÅ¡, I., JiÅÃÄek, P., Hannappel, T.Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2020.145903
Date:
February, 2020
File:
PDF, 2.28 MB
english, 2020