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[IEEE 2019 International Conference on Electronic Engineering and Informatics (EEI) - Nanjing, China (2019.11.8-2019.11.10)] 2019 International Conference on Electronic Engineering and Informatics (EEI) - A Fast Method for Measuring the Scattering Parameters of Microwave Two-Port Reciprocal Device Based on MATLAB

Wang, Bin, Sui, Qiang, Zhao, Yaya, Luo, Shicheng, Chen, Jie
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Year:
2019
Language:
english
DOI:
10.1109/EEI48997.2019.00021
File:
PDF, 9.78 MB
english, 2019
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