[IEEE 2019 IEEE Radiation Effects Data Workshop (IEEE) (in conjunction with NSREC 2019) - San Antonio, TX, USA (2019.7.8-2019.7.12)] 2019 IEEE Radiation Effects Data Workshop - Neutron Induced Single Event Upset (SEU) Testing of Commercial Flash Memory Devices with and without Embedded Error Correction Codes (ECC)
Allenspach, Mark, Peters, Michael K., Bird, John M., Fullem, Travis Z., Tostanoski, Michael J., Deaton, Terrence F., Hartojo, Kristianto, Strayer, Roy E.Year:
2019
Language:
english
DOI:
10.1109/REDW.2019.8906593
File:
PDF, 2.39 MB
english, 2019
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