An Iterative Surface Potential Algorithm Including...

IEEE Transactions on Electron Devices 2020 / 3 Vol. 67; Iss. 3

An Iterative Surface Potential Algorithm Including Interface Traps for Compact Modeling of SiC-MOSFETs

Albrecht, M., Klupfel, F. J., Erlbacher, T.
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Volume:
67
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2967507
Date:
March, 2020
File:
PDF, 3.83 MB
english, 2020
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