IR hot carrier based photodetection in titanium nitride...

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MRS Advances 2020 / 02

IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions

Güsken, Nicholas A., Lauri, Alberto, Li, Yi, Jacassi, Andrea, Matsui, Takayuki, Doiron, Brock, Bower, Ryan, Regoutz, Anna, Mihai, Andrei, Petrov, Peter K., Oulton, Rupert F., Cohen, Lesley F., Maier,
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Language:
english
Journal:
MRS Advances
DOI:
10.1557/adv.2020.129
Date:
February, 2020
File:
PDF, 1.38 MB
english, 2020
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