Microstructural Effect Limitations in the Analysis of SnAg,...

Journal of Analytical Chemistry 2020 / 1 Vol. 75; Iss. 1

Microstructural Effect Limitations in the Analysis of SnAg, SnBi and SnIn Lead-free Solders by Wavelength Dispersion X-Ray Spectrometry

Tadeusz Gorewoda,, Mzyk, Zofia, Anyszkiewicz, Jacek, Bilewska, Katarzyna, Cybulski, Andrzej, Gołębiewska-Kurzawska, Joanna, Knapik, Magdalena, Kostrzewa, Justyna, Grzegorczyk, Magdalena, Malara, Sz
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Volume:
75
Language:
english
Journal:
Journal of Analytical Chemistry
DOI:
10.1134/S1061934820010086
Date:
January, 2020
File:
PDF, 443 KB
english, 2020
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